Background

After graduation, Mr. Senn served two years as law clerk to United States District Judge William J. Castagna. In 1990, his article “The Prosecution of Religious Fraud” was published in the Florida State University Law Review. In 2002 he published, along with co-author Bob Puterbaugh, The Statute of Limitations Under RICO: Rotella and Beyond (National Legal Center for the Public Interest 2002). In 2013, Mr. Senn published “Tying Arrangements” (Sage Encyclopedia of White Collar & Computer Crime, 940-42, 2d ed. 2013). His most recent publication is “Strunk and White, and Legal Writing,” For the Defense 78-79 (May 2014). Awards include selection for Best Lawyers in America and Florida Trend’s Legal Elite, the Florida Bar President’s Pro Bono Service Award (twice), and the John H. Anderson Pro Bono Service Award.

Education

Mr. Senn received his B.S. and J.D. degrees from Florida State University. He was awarded a University Fellowship for each of his three years of law school, graduating with high honors in 1989. Mr. Senn was an Article and Notes Editor and Chair of the Article Selection Committee for the Law Review, and was awarded the Justice and Mrs. Joseph A. Boyd, Jr. Achievement Award.

Admissions & Associations

Mr. Senn was admitted to the Florida Bar in 1990, and is a member of the Bars of the United States District Courts for the Middle, Northern and Southern Districts of Florida, and of the United States Courts of Appeals for the Fourth, Eighth, Ninth, Tenth, and Eleventh Circuits. Mr. Senn currently serves on the Advisory Committee on Local Rules for the U.S. District Court for the Middle District of Florida, the Florida Bar Foundation Board of Directors, Polk Academies Executive Advisory Board, and Tenth Circuit Pro Bono Committee. He is a Graduate of Leadership Lakeland Class XXXI, and past President of the Board of Directors for Florida Rural Legal Services and Florida Equal Justice Center.

Personal

Mr. Senn resides in Lakeland with his wife, Leslie, and their children, Kaylie and Nathaniel.